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Assessing advanced methods in XPS and HAXPES for determining the thicknesses of high-k oxide materials: From ultra-thin layers to deeply buried interfaces - ScienceDirect
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XPS spectra of (a) region spectroscopy (b) C1s, (c) N1s, (d) O1s, (e)... | Download Scientific Diagram
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For the deconvolution of peaks of XPS (X-ray photoelectron spectroscopy): what is the better program for their analysis, OriginPro 8.5 or MagicPlot? | ResearchGate
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Multi-modal analysis of 2D materials with the XPS-SEM CISA Workflow - - Correlative imaging and surface analysis (CISA) workflow for combined XPS-SEM characterization
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X-ray photoelectron spectroscopy (XPS) Fe2p (a), As3d (c), S2p (e), O1s... | Download Scientific Diagram
![The XPS library website: A resource for the XPS community including - The XPS library of information, XPS spectra-base having >70,000 monochromatic XPS spectra, and spectral data processor (SDP) v8.0 software - ScienceDirect The XPS library website: A resource for the XPS community including - The XPS library of information, XPS spectra-base having >70,000 monochromatic XPS spectra, and spectral data processor (SDP) v8.0 software - ScienceDirect](https://ars.els-cdn.com/content/image/1-s2.0-S0368204821000049-gr19.jpg)